Agilent Technologies introduced a high-speed, serial pulse data generator with stimulus capability up to 7 GHz, enabling computer and semiconductor test engineers to accurately characterize components being developed for the next-generation serial buses used in high-speed transmission systems.
Agilent said its new device allows engineers, for the first time, to conduct reliable and accurate physical layer tests by providing precision low-jitter signals and offering full control of data streams for stress tests. Linear delay modulation is used to enable fast and ultra precise jitter tolerance and jitter transfer measurements.
Versatile, high-quality and the most precise data signals are the key contributions of the 7 GHz pulse data generator. Other features include:
- Data formats RZ, R1 and NRZ, with flexible parameters and fast transition times for high-quality waveforms and eye diagram measurements.
- Pattern and sequence capabilities enabling stimulus signals for the entire range of digital high-speed serial buses.
- Linear delay modulation up to 1 GHz for jitter tolerance testing.
http://www.agilent.com/find/7G_Pulse
