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Home » Keysight Simplifies WBG Bare Chip Characterization 

Keysight Simplifies WBG Bare Chip Characterization 

March 16, 2025
in Semiconductors
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Keysight Technologies has expanded its double-pulse test portfolio with a new measurement fixture designed to accurately characterize the dynamic behavior of Wide-Bandgap (WBG) power semiconductor bare chips. The fixture eliminates the need for traditional soldering or probe needles, reducing parasitic inductance to less than 10nH and enabling clean, repeatable dynamic test waveforms. The new solution is compatible with Keysight’s existing double pulse testers and is aimed at accelerating the development of highly efficient power semiconductor devices used in electric vehicles, renewable energy systems, and data centers.

WBG power semiconductors are key components in next-generation power electronics, offering greater efficiency and reliability compared to traditional silicon-based devices. Until now, measuring the dynamic characteristics of bare chips required soldering or wire bonding, introducing parasitic elements that often compromised measurement accuracy. Keysight’s new fixture allows engineers to perform non-invasive testing immediately after wafer dicing, while protecting the fragile chips from damage or arcing.

By providing a fast and accurate solution for bare chip characterization, Keysight is addressing a critical challenge in the development of WBG-based discrete devices and power modules. The fixture’s design reduces circuit parasitics and simplifies the testing process, helping engineers to obtain precise performance data earlier in the development cycle.

Key points:

• Keysight introduces a non-invasive fixture to test WBG semiconductor bare chips without soldering or probes.

• The fixture reduces parasitic power-loop inductance to below 10nH for clean dynamic waveforms.

• Compatible with Keysight’s double pulse testers for fast and repeatable bare chip testing.

• Enables safer, more efficient testing of chips for EVs, renewable energy systems, and data centers.

• Helps expedite development of power semiconductor devices and modules by reducing test complexity and risk of chip damage.

“With the introduction of the new WBG semiconductor bare chip evaluation method, we are helping the industry expedite the development of highly efficient and robust power semiconductor discrete devices and power modules,” said Thomas Goetzl, Vice President and General Manager for Keysight Automotive & Energy Solutions.

Tags: Keysight
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Jim Carroll

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