VI Systems GmbH, which specialized in high performance optical semiconductor components, is expanding its service portfolio for optic semiconductor wafers of up to 6 inches.
The new semi-automatic wafer prober station performs high-speed electrical and optical testing of wafers early in the manufacturing process. The test parameters include optical output power and optical spectrum. Electrical parameters which can be tested include operation voltage, bias voltage, drive current and dark current.
In addition, high frequency characterization test of up to 38 GHz can be performed including digital transmission experiments of up to 64 Gbps. The new facilities also include nearfield and farefield analysis tools as well microscopic characterization equipment.
